High Power tube above Super Flexible simultaneous WDXRF, for high-throughput elemental analysis of solids, powders and alloys.
- Up to 40 Fixed Channels For rapid analysis and throughput.
- X-Ray Tube Above Design No risk of early tube failure due to sample ingress into tube window.
- Heavy and Light Element Scanner Optional wide range scanning goniometer F to U, for non routine elements.
- BG Measurement for trace elements Improved accuracy and greater flexibility and for a variety of samples: traces to majors.
- XRD Channel When equipped with XRD channel, Simultix 15 can be performed the quantitative analysis by XRF and XRD.
- APC - Automatic Pressure Control Maintains a constant vacuum level to dramatically improve light element analysis precision.
- Automation Optional 48 pos. Sample Changer available or a Sample Loading Unit provides belt-in feed from a third party sample preparation automation system.
Exceptional speed, precise elemental analysis
Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity. Coupled to powerful but easy-to-use software, with extensive data reduction capabilities and maintenance functionality, this instrument is the perfect elemental analysis metrology tool.
Exceptional Throughput and Automation Options
For high-throughput applications, automation is a fundamental requirement. Rigaku Simultix 15 WDXRF spectrometer may be fitted with a 48-position Automatic Sample Changer (ASC). For full automation, the optional Sample Loading Unit provides right or left side belt-in feed from a third party sample preparation automation system.
Exceptional Flexibility for a simultaneous WDXRF
Each Rigaku Simultix 15 XRF spectrometer is customized for your specific elemental analysis applications with a set of discrete, optimized fixed channels for the elements of interest. All channels measure simultaneously – without moving parts, without time delay and without compromise. This makes simultaneous WDXRF the best solution in terms of time-to-result, precision, reliability, low cost-per-analysis and instrument longevity. For additional flexibility, Simultix 15 wavelength dispersive X-ray fluorescence spectrometer may be optionally equipped with a scanning goniometer for analysis of other elements as well as XRD channels for phase analysis.
