Xenocs X-Ray Scattering | Xeuss 2.0
For many years, high performance SAXS measurements were limited to synchrotrons, as only such large facilities were able to simultaneously achieve high brilliance, low parasitic scattering, high resolution & versatility.
With the introduction of the Xeuss a few years ago, Xenocs made these four key parameters available to the home lab, opening the way to new SAXS/WAXS measurement capabilities.
Xenocs is now pleased to be introducing a new generation of SAXS/WAXS system: Xeuss 2.0
The Xeuss 2.0 was designed as a beamline for your own lab.
It is the ouput of more than 14 years of R&D in the company and integrates all the innovative technological bricks developed by Xenocs all along these years. The Xenocs proprietary single reflection optics together with Xenocs new generation of scatterless slits generate a very intense X-ray beam with an ultra low level of parasitic signal. The Xeuss 2.0 also integrates the latest generation Pilatus detectors from Dectris for unmatched measurement capabilities.
High brilliance
Low parasitic scattering
High resolution
Versatility
The unique design of the Xeuss 2.0 combines maximum versatility and ergonomics in order to meet your experimental needs.
The unique performance of the Xeuss 2.0 is enhanced by a powerful and user friendly software package for system control, data acquisition and analysis.
To contact Diffraction Technology about Xenocs X-Ray Scattering | Xeuss 2.0 use Get a quote.
For many years, high performance SAXS measurements were limited to synchrotrons, as only such large facilities were able to simultaneously achieve high brilliance, low parasitic scattering, high resolution & versatility.
With the introduction of the Xeuss a few years ago, Xenocs made these four key parameters available to the home lab, opening the way to new SAXS/WAXS measurement capabilities.
Xenocs is now pleased to be introducing a new generation of SAXS/WAXS system: Xeuss 2.0
The Xeuss 2.0 was designed as a beamline for your own lab.
It is the ouput of more than 14 years of R&D in the company and integrates all the innovative technological bricks developed by Xenocs all along these years. The Xenocs proprietary single reflection optics together with Xenocs new generation of scatterless slits generate a very intense X-ray beam with an ultra low level of parasitic signal. The Xeuss 2.0 also integrates the latest generation Pilatus detectors from Dectris for unmatched measurement capabilities.
High brilliance
Low parasitic scattering
High resolution
Versatility
The unique design of the Xeuss 2.0 combines maximum versatility and ergonomics in order to meet your experimental needs.
The unique performance of the Xeuss 2.0 is enhanced by a powerful and user friendly software package for system control, data acquisition and analysis.
To contact Diffraction Technology about Xenocs X-Ray Scattering | Xeuss 2.0 use Get a quote.
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