Xenocs - X-Ray Scattering | Xeuss 2.0

X-Ray Scattering | Xeuss 2.0

For many years, high performance SAXS measurements were limited to synchrotrons, as only such large facilities were able to simultaneously achieve high brilliance, low parasitic scattering, high resolution & versatility.

With the introduction of the Xeuss a few years ago, Xenocs made these four key parameters available to the home lab, opening the way to new SAXS/WAXS measurement capabilities.

Xenocs is now pleased to be introducing a new generation of SAXS/WAXS system:  Xeuss 2.0

The Xeuss 2.0 was designed as a beamline for your own lab.

It is the ouput of more than 14 years of R&D in the company and integrates all the innovative technological bricks developed by Xenocs all along these years. The Xenocs proprietary single reflection optics together with Xenocs new generation of scatterless slits generate a very intense X-ray beam with an ultra low level of parasitic signal. The Xeuss 2.0 also integrates the latest generation Pilatus detectors from Dectris for unmatched measurement capabilities.

 

High brilliance

• An intense and collimated beam with precise control of divergence, to avoid smearing effects and enable the study of oriented structures.

Low parasitic scattering

• A beamline designed to minimize parasitic scattering. By producing a high signal-to-noise ratio, measurement of low intensity scattered signals over a large q range, including on highly diluted systems, is made possible.

High resolution

• A long sample-to-detector distance to achieve very low qmin values together with high angular resolution.

Versatility

• High system versatility and ergonomics to adapt to a variety of experimental constraints.

 

Maximum versatility and ergonomics

The unique design of the Xeuss 2.0 combines maximum versatility and ergonomics in order to meet your experimental needs.

• Open & versatile sample environment
  • The Xeuss 2.0 is equipped with a large sample chamber that can operate either in air or vacuum. A wide range of both proprietary and third party sample holders can be easily mounted on motorized sample stages for both transmission and GISAXS.
• Automatic change of resolution setting
  • The Xeuss 2.0 is equipped with a motorized beamstop and the new generation of Xenocs variable aperture scatterless slits. These components are fully controlled by software for automatic optimization of flux and resolution, depending on experimental conditions.
• Most advanced data collection capability on the market.
• Full configurability and upgradability

Xeuss 2.0 software solutions: powerful and user friendly 

The unique performance of the Xeuss 2.0 is enhanced by a powerful and user friendly software package for system control, data acquisition and analysis.

• System control and data acquisition software
  • The Xeuss 2.0 control and data acquisition software features both easy to use graphical user interface and macro script mode for quick system access and advanced operations.
  • The software enables the complete monitoring of data acquisition parameters. Acquisition in single or batch mode can be controlled in just a few clicks. Auto alignment of the complete beamline, automatic change of collimation, sample stages, beamstop and detector settings are all available. Control of various sample environments is also possible.
  • With comprehensive features and advanced ergonomics, the Xeuss 2.0 system control and data acquisition software ensures maximum measurement throughput.
• Data processing and analysis software
  • The data processing and analysis software for the Xeuss 2.0 enables an easy treatment of 2D and 1D data for both SAXS, WAXS and SWAXS, through its intuitive graphical user interface.
  • The software allows easy processing of single or large sets of 2D images, masking, substracting and 1D integration in azimuthal or polar coordinates over the complete pattern or on a predefined region of interest.
  • Automatic recombination of 1D curves from SAXS and WAXS is made possible at the push of a button.
  • Preliminary structure parameters such as the radius of gyration are also included.
  • Data fi les can easily be exported to most advanced data analysis software packages such as SASfi t or ATSAS.

 

Read more...

To contact Diffraction Technology about Xenocs X-Ray Scattering | Xeuss 2.0 use Get A Quote.

For many years, high performance SAXS measurements were limited to synchrotrons, as only such large facilities were able to simultaneously achieve high brilliance, low parasitic scattering, high resolution & versatility.

With the introduction of the Xeuss a few years ago, Xenocs made these four key parameters available to the home lab, opening the way to new SAXS/WAXS measurement capabilities.

Xenocs is now pleased to be introducing a new generation of SAXS/WAXS system:  Xeuss 2.0

The Xeuss 2.0 was designed as a beamline for your own lab.

It is the ouput of more than 14 years of R&D in the company and integrates all the innovative technological bricks developed by Xenocs all along these years. The Xenocs proprietary single reflection optics together with Xenocs new generation of scatterless slits generate a very intense X-ray beam with an ultra low level of parasitic signal. The Xeuss 2.0 also integrates the latest generation Pilatus detectors from Dectris for unmatched measurement capabilities.

 

High brilliance

• An intense and collimated beam with precise control of divergence, to avoid smearing effects and enable the study of oriented structures.

Low parasitic scattering

• A beamline designed to minimize parasitic scattering. By producing a high signal-to-noise ratio, measurement of low intensity scattered signals over a large q range, including on highly diluted systems, is made possible.

High resolution

• A long sample-to-detector distance to achieve very low qmin values together with high angular resolution.

Versatility

• High system versatility and ergonomics to adapt to a variety of experimental constraints.

 

Maximum versatility and ergonomics

The unique design of the Xeuss 2.0 combines maximum versatility and ergonomics in order to meet your experimental needs.

• Open & versatile sample environment
  • The Xeuss 2.0 is equipped with a large sample chamber that can operate either in air or vacuum. A wide range of both proprietary and third party sample holders can be easily mounted on motorized sample stages for both transmission and GISAXS.
• Automatic change of resolution setting
  • The Xeuss 2.0 is equipped with a motorized beamstop and the new generation of Xenocs variable aperture scatterless slits. These components are fully controlled by software for automatic optimization of flux and resolution, depending on experimental conditions.
• Most advanced data collection capability on the market.
• Full configurability and upgradability

Xeuss 2.0 software solutions: powerful and user friendly 

The unique performance of the Xeuss 2.0 is enhanced by a powerful and user friendly software package for system control, data acquisition and analysis.

• System control and data acquisition software
  • The Xeuss 2.0 control and data acquisition software features both easy to use graphical user interface and macro script mode for quick system access and advanced operations.
  • The software enables the complete monitoring of data acquisition parameters. Acquisition in single or batch mode can be controlled in just a few clicks. Auto alignment of the complete beamline, automatic change of collimation, sample stages, beamstop and detector settings are all available. Control of various sample environments is also possible.
  • With comprehensive features and advanced ergonomics, the Xeuss 2.0 system control and data acquisition software ensures maximum measurement throughput.
• Data processing and analysis software
  • The data processing and analysis software for the Xeuss 2.0 enables an easy treatment of 2D and 1D data for both SAXS, WAXS and SWAXS, through its intuitive graphical user interface.
  • The software allows easy processing of single or large sets of 2D images, masking, substracting and 1D integration in azimuthal or polar coordinates over the complete pattern or on a predefined region of interest.
  • Automatic recombination of 1D curves from SAXS and WAXS is made possible at the push of a button.
  • Preliminary structure parameters such as the radius of gyration are also included.
  • Data fi les can easily be exported to most advanced data analysis software packages such as SASfi t or ATSAS.

 

Read less...

To contact Diffraction Technology about Xenocs X-Ray Scattering | Xeuss 2.0 use Get A Quote.