Environmental Test Chambers - Memory IC Burn-In Chamber Get latest price

Environmental Test Chambers - Memory IC Burn-In Chamber

In Stock

Semi-conductor device reliability evaluation and massive screening

Application

• Semi-conductor parts burn-in test
• Semi-conductor device reliability evaluation and massive screening

Features

• Program Pattern Control
• Convenient Inspection
• AUTO / MAN Operation
• Simple Interface
• Wide Range of Experiment Temperature
• Dew Condensation Prevention
• N2 Gas Purge Function

Merits & Characteristics

• Outstanding temperature adjusting ability by employing high precision controller with P.I.D control method with built-in auto tuning function
• Can set repetition and number of times of testing condition
• Can select circuit board injection method in horizontal and vertical direction
• Remote solution provides functions of remote monitoring and manipulation

To contact Samwon Technology about Environmental Test Chambers - Memory IC Burn-In Chamber use Get a quote.

Semi-conductor device reliability evaluation and massive screening

Application

• Semi-conductor parts burn-in test
• Semi-conductor device reliability evaluation and massive screening

Features

• Program Pattern Control
• Convenient Inspection
• AUTO / MAN Operation
• Simple Interface
• Wide Range of Experiment Temperature
• Dew Condensation Prevention
• N2 Gas Purge Function

Merits & Characteristics

• Outstanding temperature adjusting ability by employing high precision controller with P.I.D control method with built-in auto tuning function
• Can set repetition and number of times of testing condition
• Can select circuit board injection method in horizontal and vertical direction
• Remote solution provides functions of remote monitoring and manipulation

Read less...

To contact Samwon Technology about Environmental Test Chambers - Memory IC Burn-In Chamber use Get a quote.